SprintMVP 400 Systems

Three-Axis Measurement for Larger Parts and Assemblies

SprintMVP 400

The SprintMVP 400 floor model systems provide three-axis measurement for larger parts or assemblies and a large number of small parts at one time. Programmable zoom optics combined with all LED illumination and a color camera provide magnified viewing up to 175x with standard optics.

SprintMVP Features:

SprintMVP 400 systems have a granite base and a cantilever design that allows easy access to the XY stage.

Powered by Measure-X® Metrology Software

SprintMVP 400 systems run easy-to-use Measure-X metrology software. With an extensive array of measurement tools, including video autofocus, motorized zoom, high level edge detection, easy to see icons and a point and click interface, Measure-X makes it simple for everyone to get accurate, repeatable measurements.

Key Features and Options
Monitors and Display Equipment
Monitor, keyboard, and mouse are optional
Zoom Lens
Motorized (standard)
VectorLight™ Ringlight and LED backlight
Front Panel Controls, Manual Indexer, NIST Traceable Linear Scale, Optical Accessory Kit
Software Options
  • Reporting software
  • MeasureFit® Plus
Download the SprintMVP 400 Datasheet to learn more

Download the SprintMVP 400 datasheet to learn more about this product and how it can work for you.

SprintMVP 400 Datasheet (188 KB)

Contact your local distributor

X-Y Axis English Units Metric Units
XY Travel 18" x 18" 450 x 450 mm
XY Accuracy* E2 = (3.0 + 8L/1000) µm
Scale Resolution 0.00002" 0.5 µm
Z Travel 6" 150 mm
Z Travel (optional) 12" 300 mm
Z Accuracy** E1 = (4.0 + 8L/1000) µm
Z Accuracy** (with optional touch probe or laser) E1 = (2.5 + 8L/1000) µm
Scale Resolution 0.00002" 0.5 µm
Optical Performance
Working Distance (with VectorLight) 2.75" 70 mm
Magnification on 20" Monitor 35x to 175x
Field of View 0.07" - 0.35" 1.8 - 8.9 mm
Load Capacity 66 lbs 30 kg
Temperature, safe operating 59°F - 86°F 15°C - 30°C
Temperature to meet specifications 68°F ± 2°F 20°C ± 1°C
*Where L = Length in mm, with evenly distributed 10 kg load in the standard measuring plane. Depending on load distribution, accuracy at maximum rated load may be less than standard accuracy. XY axis artifact: 25 intersection grid reticle in the standard measuring plane. The standard measuring plane is defined as a plane that is 25 mm above the worktable.
**Z axis artifact: QVI step gage or master gage blocks.