StarLite 150
A compact self-contained measurement station
The StarLite 150 is the newest design in a complete non-contact inspection system with interactive measurement capabilities at your fingertips. It is everything you need for accurate video measurement.
StarLite 150 is an excellent choice for inspection and measurement applications within the plastics, medical equipment and parts, automotive, aerospace, electronics industries and more.
Read about a medical tubing company using StarLite 150 for their inspections
Features:
- Cast aluminum base and column with precision stages
- High-resolution digital color camera and zoom optics
- Accurate XY measurements to better than 0.0002 inches
- Advanced image processing capability with automatic edge trace and multiple field of view tools
- Measure-X® metrology software for manual systems
Interactive Measurement at your fingertips
StarLite 150 – fast, accurate and repeatable results you expect from a measurement system.
StarLite 150 is designed for ease of use, with ergonomic controls, and innovative full-featured software. Increase your productivity with optional front panel controls – motorized zoom, XYZ zero set, enter point button, skew alignment, and an inch/millimeter switch.
Measure-X metrology software guides users through measurement routines with graphical icons, and unique tools for fast results on a manual measurement system.
| Monitors and Display Equipment |
| Monitor, computer, keyboard, and mouse are optional |
| Zoom Lens |
| Motorized (standard) |
| Illumination |
| VectorLight™ Ringlight and LED backlight |
| Miscellaneous |
| Front Panel Controls, Manual Indexer, NIST Traceable Linear Scale, Optical Accessory Kit |
| Software Options (For Systems with Measure-X) |
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Download the StarLite 150 datasheet to learn more about this product and how it can work for you.
StarLite 150 Datasheet (700 KB)
| X-Y Axis | English Units | Metric Units |
| XY Travel | 6" x 3" | 150 x 75 mm |
| XY Accuracy* | E2 = (4.5 + 8L/1000) µm | |
| Scale Resolution | 0.00004" | 1.0 µm |
| Z-Axis | ||
| Z Travel | 5" | 125 mm |
| Z Accuracy** | E1 = (7.0 + 8L/1000) µm | |
| Scale Resolution | 0.00004" | 1.0 µm |
| Optical Performance | ||
| Working Distance (with VectorLight) | 2.75" | 70 mm |
| Magnification on 20" Monitor | 35x to 535x | |
| Field of View | 0.070" - 0.35" | 1.8 - 8.9 mm |
| Physical | ||
| Load Capacity | 15 lbs | 7 kg |
| Environmental | ||
| Temperature, safe operating | 59°F - 86°F | 15°C - 30°C |
| Temperature to meet specifications | 68°F ± 2°F | 20°C ± 1°C |
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For granite-based systems with larger XYZ travel ranges, Click here. *Where L = Length in mm, with evenly distributed 10 kg load in the standard measuring plane. Depending on load distribution, accuracy at maximum rated load may be less than standard accuracy. XY axis artifact: 25 intersection grid reticle in the standard measuring plane. The standard measuring plane is defined as a plane that is 25 mm above the worktable. **Z axis artifact: QVI step gage or master gage blocks. |
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